i1iSis XL with OBC

i1iSis XL with Optical Brightening Compensation (OBC)
The automated solution for high speed chart measurements, now with industry first true OBC correction solution Click here for more information about X-Rite’s industry-leading Optical Brightening Compensation solution.

Productive. Fast. Easy. Precise.
In high production environments like prepress, photo processing, high speed digital printing, and fine art printing, measuring color test charts to keep your color management profiles up-to-date can be a labor intensive and time consuming process. The new i1iSis family of automatic chart readers sets new standards in terms of speed, accuracy and handling – allowing you more time to focus on taking care of your customers.

Because it is built on the award-winning i1 spectral technology, you’ll capture the full spectral data of the charts you measure, assuring the most accurate measurements and profiles. In a single chart measurement cycle you can read both UVcut and measurements with NoFIlter. I1iSis is a perfect complement to the i1 family of solutions, especially high-end applications like professional photo and proofing where consistency of measurements from instrument to instrument is mission critical.

i1iSis features include

• Switchable UV Illumination to capture NoFilter and UVcut filter data in a single measurement cycle.
• Built-in vision system that offers high tolerance for how charts are aligned as they are fed into the system and automatically corrects for misalignment.
• Barcode reading, for chart identification adds further ease of use and error safety.

i1iSis is available in two configurations, i1iSis and i1iSis XL:
i1 iSis: For charts with a width of up to 23 cm, 9 inches (A4 or letter format)
i1 iSis XL: For charts with a width of up to 33 cm or 13 inches. i1iSis XL provides A3+ and tabloid format to measure charts with as many as 2,500 patches printed on a single page, eliminating the time consuming task of cutting charts and feeding multiple pages.

Do you need more versatility? Do you have to measure thicker substrates? Please consider the i1iO Automated Scanning Table.